RNPA038 Series Double Tipped Contact Probes, Min Pitch0.5mm 【50 Pieces Per Package】

Types Typical Intended Use of Contact Probes

●Contact Probes	It can be widely used in printed circuit boards, packaged circuit boards, semiconductors, circuit testing, harness testing, etc. ICT and PCB2 types are available for different purposes. ICT is suitable for inspection of substrates with large strokes and various integrated circuits. PCB probe is cheaper than ICT probe and is used for inspection of individual printed substrates.
● Rotary type Contact Probes	Since the plunger rotates with the change of the stroke, the flux and the oxide protective film will be destroyed. Mainly used for open circuit and short circuit test of printed circuit board.
● Integral Contact Probes	An integral probe consisting of a pin from the tip to the end. Allows flow of stable current, regardless of stroke.
●Double tipped Contact Probes	No probe holder is needed, and it can be installed with a narrower pitch.

Punching machine (automatic or manual)                    Circuit board for conductivity check

■Precautions of Contact Probes
■General environmental conditions of Contact Probes
· Operating ambient temperature is 10 to 40 degrees, humidity is 30% below
· Surrounding environment: An environment where there is no dust, corrosive gas, oil, etc. so that the probe is not polluted.
■Stroke condition
· Please apply axial load only, not transverse load.
· Exceeding the specified stroke (2/3 of the full stroke) will significantly reduce the life of the probe.
· The probe life may be shortened if moving at a speed of more than 60 times /min (constant speed).
■Current application condition
· Please apply current in a static state and in contact with the target contact within the specified stroke.
· The probe life may be significantly reduced if current is applied during operation within the specified stroke, outside the specified stroke, or without contact with the target contact (open circuit).
· The probe may not meet the maximum allowable current listed in the catalog due to aging and other reasons. Please design to ensure there is enough margin in actual use.
■Voltage application condition
· Please apply voltage in a static state and in contact with the target contact within the specified stroke.
· Do not apply voltage without contact with the target contact (open circuit). Otherwise, it will cause electric discharge when it is about to be touched, causing damage to the probe.
· When applying high voltage to the probe, please strictly observe the application conditions of current and voltage, and pay attention to avoid discharge phenomenon and instantaneous huge current generated during discharge.
■Maximum allowable current
· The maximum allowable current listed in the product catalog is the maximum value of continuous current flowing within 1 minute under the above-mentioned conditions (general environment, stroke, application of current and voltage).
■Contact resistance of Contact Probes
· The resistance value listed in the product catalog refers to the representative value measured by applying a current of 10 mA to the probe and making it contact with the pure silver terminal under the above-mentioned conditions (general environment, stroke, application of current and voltage).
· If the flowing current is too large, the resistance may increase due to the internal aging of the contact or probe.
· After repeated operations within the specified stroke, the resistance may increase due to the aging of the contact or probe.
■Reference number of replacements
· The reference number of replacements listed in the product catalog refers to the reference number for probes that can be used normally when the current is 10mA under the above conditions (general environment, stroke, application of current and voltage).
· When the resistance increases or the spring pressure decreases due to the difference in the operating environment and conditions, the probe may need to be replaced before the reference number is reached. Please replace it in time according to actual usage.
■Spring pressure
· If the probe temperature exceeds 80 ℃, the spring pressure will drop.
· If the current value is increased, the spring pressure may drop due to the heating of the probe.
■Mounting hole size for press-fit (reference)
· Reference value only, depending on the material and thickness of the resin plate. Please design referring to the size of the probe holder press-fit part.

MISUMI Contact Probes NP45HD series matching probe holder product NR45/NR45T

Please order of Contact Probes after selecting part number and parameters according to the selection steps to .

Part Number of Contact Probes (Type·No.)	-	LR
RNPA038	-	J1U

When ordering, specify the number of boxes.
 Order quantity 1 means purchasing 1 box (50 pcs).

Part Number		Tip Shape		Mounting Pitch (min)	Full stroke (Rated stroke)	Spring pressure (Rated stroke)	Maximum Allowable Current	Resistance	Reference of replacement number of use
Type	No.	L (Left)	R (Right)
RNPA	038	B	U J B	19.7mil/0.5mm	1.1mm (0.65mm)	30±6gf	0.5A	100mΩ	100,000 times
		J1	U J